@inproceedings{EbliPfostWendel2015,
  author    = {Michael Ebli and Martin Pfost and Christoph Wendel},
  title     = {Transient junction temperature measurements of power MOSFETs in the μs range},
  booktitle = {SEMI-THERM : 31st Annual Semiconductor Thermal Measurement and Management Symposium ; proceedings 2015 ; San Jose, CA, USA, March 15-19, 2015},
  pages     = {267},
  doi       = {10.1109/SEMI-THERM.2015.7100171},
  year      = {2015},
}