TY - JOUR U1 - Zeitschriftenartikel, wissenschaftlich - begutachtet (reviewed) A1 - Stiedl, Jan A1 - Green, Simon A1 - Chassé, Thomas A1 - Rebner, Karsten T1 - Auger electron spectroscopy and UV–Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces JF - Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces N2 - We report an investigation into the distribution of copper oxidation states in oxide films formed on the surfaces of technical copper. The oxide films were grown by thermal annealing at ambient conditions and studied using Auger depth profiling and UV–Vis spectroscopy. Both Auger and UV–Vis data were evaluated applying multivariate curve resolution (MCR). Both experimental techniques revealed that the growth of Cu2O dominates the initial ca. 40 nm of oxide films grown at 175 °C, while further oxide growth is dominated by CuO formation. The largely coincident results from both experimental approaches demonstrates the huge benefit of the application of UV–Vis spectroscopy in combination with MCR analysis, which provides access to information on chemical state distributions without the need for destructive sample analysis. Both approaches are discussed in detail. KW - oxide layer KW - copper KW - UV–vis spectroscopy KW - multivariate KW - Auger electron spectroscopy Y1 - 2019 SN - 0169-4332 SS - 0169-4332 U6 - https://doi.org/10.1016/j.apsusc.2019.05.028 DO - https://doi.org/10.1016/j.apsusc.2019.05.028 VL - 486 SP - 354 EP - 361 S1 - 6 PB - Elsevier CY - Amsterdam ER -