@inproceedings{KieselKernWicht2017, author = {Kiesel, Sebastian and Kern, Thomas and Wicht, Bernhard}, title = {A ramped-gate voltage sensing scheme for embedded multilevel flash in automotive}, booktitle = {Analog Workshop 2017 : March 2-3, 2017, Technische Universit{\"a}t Berlin}, editor = {Gerfers, Friedel}, url = {http://www.msc.tu-berlin.de/analog_workshop_2017/home/}, institution = {Technik}, pages = {1}, year = {2017}, abstract = {Multilevel-cell (MLC) flash is commonly deployed in today's high density NAND memories, but low latency and high reliability requirements make it barely used in automotive embedded flash applications. This paper presents a time domain voltage sensing scheme that applies a dynamic voltage ramp at the cells' control gate (CG) in order to achieve fast and reliable sensing suitable for automotive applications.}, language = {en} }