TY  - JOUR
U1  - Wissenschaftlicher Artikel
A1  - Quinones, Dustin
A1  - Braun, Kai
A1  - Ulitzsch, Steffen
A1  - Bäuerle, Tim
A1  - Lorenz, Günter
A1  - Kandelbauer, Andreas
A1  - Meixner, Alfred
A1  - Chasse, Thomas
T1  - Bonding of activated ethylene-propylene rubber to surface-modified stainless steel
JF  - Thin solid films
N2  - Film formation of self synthesized Polymer EPM–g–VTMDS (ethylene–propylene rubber, EPM, grafted with vinyltetramethyldisiloxane, VTMDS) was studied regarding bonding to adhesion promoter vinyltrimethoxysilane (VTMS) on oxidized 18/10 chromium/nickel–steel (V2A) stainless steel surfaces. Polymer films of different mixed solutions including commercial siloxane and silicone, dimethyl, vinyl group terminated crosslinker (HANSA SFA 42100, CAS# 68083-19-2, 0.35 mmol Vinyl/g) and platinum, 1,3-diethenyl-1,1,3,3-tetramethyldisiloxane complex Karstedt's catalyst (ALPA–KAT 1, CAS# 68478-92-2) were spin coated on V2A stainless steel surfaces with adsorbed VTMS thin layers in order to analyze film formation of EPM–g–VTMDS at early stages. Surface topography and chemical bonding of the high performance polymers on different oxidized V2A surfaces were investigated with X–ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), scanning electron microscopy (SEM) and surface enhanced Raman spectroscopy (SERS). AFM and SEM as well as XPS results indicated that the formation of the polymer film proceeds via growth of polymer islands. Chemical signatures of the essential polymer contributions, linker and polymer backbones, could be identified using XPS core level peak shape analysis and also SERS. The appearance of signals which are related to Si–O–Si can be seen as a clear indication of lateral crosslinking and silica network formation in the films on the V2A surface.
KW  - X–ray photoelectron spectroscopy
KW  - atomic force microscopy
KW  - NaOH treatment
KW  - stainless steel V2A
KW  - ethylene–propylene rubber
KW  - Vinyltetramethyldisiloxane
KW  - surface enhanced Raman spectroscopy
Y1  - 2023
SN  - 0040-6090
SS  - 0040-6090
U6  - https://doi.org/10.1016/j.tsf.2022.139642
DO  - https://doi.org/10.1016/j.tsf.2022.139642
IS  - 765
SP  - 12
S1  - 12
PB  - Elsevier
CY  - Amsterdam
ER  -