Nanoscale characterization of single Au nanorods by confocal microscopy
- We analyzed the scattering patterns of individual Au nanorods detected by means of confocal interference scattering microscopy in combination with a higher order laser mode. We placed the Au nanorods at the interface between two dielectric media and examined the influence of different interfaces on the signal amplitude, the signal-to-noise ratio as well as on the precision of topological measurements. Approaching the index matching regime allows for topological measurements with high accuracy minimizing the acquisition time. We were also able to track the position and the orientation of particles embedded in water even when they were not thoroughly sticking to the glass surface. These results underscore the potential of the presented technique for applications in life sciences.
| Author of HS Reutlingen | Wackenhut, Frank |
|---|---|
| DOI: | https://doi.org/10.1016/j.apsusc.2008.07.164 |
| ISSN: | 0169-4332 |
| Published in: | Applied surface science |
| Publisher: | Elsevier |
| Place of publication: | Amsterdam |
| Document Type: | Journal article |
| Language: | English |
| Publication year: | 2009 |
| Volume: | 255 |
| Issue: | 10 |
| Page Number: | 5 |
| First Page: | 5391 |
| Last Page: | 5395 |
| DDC classes: | 530 Physik |
| 660 Technische Chemie | |
| 670 Industrielle und handwerkliche Fertigung | |
| Open access?: | Nein |
| Licence (German): |  In Copyright - Urheberrechtlich geschützt |
