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The need and opportunities of electromigration-aware integrated circuit design

  • Electromigration (EM) is becoming a progressively severe reliability challenge due to increased interconnect current densities. A shift from traditional (post-layout) EM verification to robust (pro-active) EM aware design - where the circuit layout is designed with individual EM-robust solutions - is urgently needed. This tutorial will give an overview of EM and its effects on the reliability of present and future integrated circuits (ICs). We introduce the physical EM process and present its specific characteristics that can be affected during physical design. Examples of EM countermeasures which are applied in today’s commercial design flows are presented. We show how to improve the EM-robustness of metallization patterns and we also consider mission proiles to obtain application-oriented current density limits. The increasing interaction of EM with thermal migration is investigated as well. We conclude with a discussion of application examples to shift from the current post layout EM verification towards an EM aware physical design process. Its methodologies, such as EM-aware routing, increase the EM-robustness of the layout with the overall goal of reducing the negative impact of EM on the circuit’s reliability.

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Metadaten
Name:Scheible, Jürgen
DOI:https://doi.org/10.1145/3240765.3265971
ISBN:978-1-4503-5950-4
Erschienen in:Proceedings of the International Conference on Computer-Aided Design ICCAD '18
Publisher:ACM
Place of publication:New York
Editor:Iris Bahar
Document Type:Conference Proceeding
Language:English
Year of Publication:2018
Tag:current density; electromigration; reliability; thermal migration
Pagenumber:8
Dewey Decimal Classification:620 Ingenieurwissenschaften und Maschinenbau
Open Access:Nein
Licence (English):License Logo  Lizenzbedingungen ACM