Immersion transmission ellipsometry (ITE) for the determination
- The capability of the method of Immersion transmission ellipsometry (ITE) (Jung et al. Int Patent WO, 2004/109260) to not only determine three-dimensional refractive indices in anisotropic thin films (which was already possible in the past), but even their gradients along the z-direction (perpendicular to the film plane) is investigated in this paper. It is shown that the determination of orientation gradients in deep-sub-lm films becomes possible by applying ITE in combination with reflection ellipsometry. The technique is supplemented by atomic force microscopy for measuring the film thickness. For a photooriented thin film, no gradient was found, as expected. For a photo-oriented film, which was subsequently annealed in a nematic liquid crystalline phase, an order was found similar to the one applied in vertically aligned nematic displays, with a tilt angle varying along the z-direction. For fresh films, gradients were only detected for the refractive index perpendicular to the film plane, as expected.
Author of HS Reutlingen | Jung, Carl Christoph |
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DOI: | https://doi.org/10.1007/s00340-013-5729-2 |
ISSN: | 0946-2171 |
eISSN: | 1432-0649 |
Erschienen in: | Applied physics B : Lasers and optics |
Publisher: | Springer |
Place of publication: | Berlin |
Document Type: | Journal article |
Language: | English |
Publication year: | 2014 |
Volume: | 116 |
Issue: | 3 |
Page Number: | 7 |
First Page: | 533 |
Last Page: | 539 |
DDC classes: | 530 Physik |
Open access?: | Nein |
Licence (German): | In Copyright - Urheberrechtlich geschützt |