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Auger electron spectroscopy and UV–Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces

  • We report an investigation into the distribution of copper oxidation states in oxide films formed on the surfaces of technical copper. The oxide films were grown by thermal annealing at ambient conditions and studied using Auger depth profiling and UV–Vis spectroscopy. Both Auger and UV–Vis data were evaluated applying multivariate curve resolution (MCR). Both experimental techniques revealed that the growth of Cu2O dominates the initial ca. 40 nm of oxide films grown at 175 °C, while further oxide growth is dominated by CuO formation. The largely coincident results from both experimental approaches demonstrates the huge benefit of the application of UV–Vis spectroscopy in combination with MCR analysis, which provides access to information on chemical state distributions without the need for destructive sample analysis. Both approaches are discussed in detail.

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Metadaten
Name:Rebner, Karsten
DOI:https://doi.org/10.1016/j.apsusc.2019.05.028
ISSN:0169-4332
Erschienen in:Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
Publisher:Elsevier
Place of publication:Amsterdam
Document Type:Article
Language:English
Year of Publication:2019
Tag:Auger electron spectroscopy; UV–vis spectroscopy; copper; multivariate; oxide layer
Volume:486
Pagenumber:6
First Page:354
Last Page:361
Dewey Decimal Classification:660 Technische Chemie
Open Access:Nein