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A novel gate driving approach to balance the transient current of parallel-connected GaN-HEMTs

  • To enable higher current handling capability of GaN-based DC/DC converters, devices have to be used in parallel. However, their switching times differ, especially if their threshold voltages are not identical, which causes unbalanced device current. This paper focuses on the homogeneous distribution of turn-on switching losses of GaN-HEMTs connected in parallel. By applying a new gate driver concept, the transient current is distributed evenly. The effectiveness of this concept is demonstrated by double pulse measurements, for switching currents up to 45A and a voltage of 400V. A uniform current distribution is achieved, including a reduction of the turn-on losses by 50% compared to a conventional setup.

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Metadaten
Author of HS ReutlingenHackel, Jonathan; Pfost, Martin
URL:https://ieeexplore.ieee.org/document/8403150
ISBN:978-3-8007-4540-1
Erschienen in:CIPS 2018 : 10th International Conference on Integrated Power Electronics Systems ; March, 20-22, 2018, Stuttgart, Germany
Publisher:VDE Verlag GmbH
Place of publication:Berlin ; Offenbach
Document Type:Conference proceeding
Language:English
Publication year:2018
Page Number:4
First Page:305
Last Page:308
DDC classes:620 Ingenieurwissenschaften und Maschinenbau
Open access?:Nein
Licence (German):License Logo  In Copyright - Urheberrechtlich geschützt