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A novel approach for automatic common-centroid pattern generation

  • This paper introduces a novel placement methodology for a common-centroid (CC) pattern generator. It can be applied to various integrated circuit (IC) elements, such as transistors, capacitors, diodes, and resistors. The proposed method consists of a constructive algorithm which generates an initial, close to the optimum, solution, and an iterative algorithm which is used subsequently, if the output of constructive algorithm does not satisfy the desired criteria. The outcome of this work is an automatic CC placement algorithm for IC element arrays. Additionally, the paper presents a method for the CC arrangement evaluation. It allows for evaluating the quality of an array, and a comparison of different placement methods.

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Author of HS ReutlingenBorisov, Vadim; Langner, Kerstin; Scheible, Jürgen
Erschienen in:SMACD 2017 : 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design : 12th - 15th June 2017, Giardini Naxos, Taormina, Italy
Place of publication:Piscataway, NJ
Document Type:Conference proceeding
Publication year:2017
Page Number:4
DDC classes:620 Ingenieurwissenschaften und Maschinenbau
Open access?:Nein
Licence (German):License Logo  In Copyright - Urheberrechtlich geschützt