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Analog integrated circuit sizing still relies heavily on human expert knowledge as previous automation approaches have not found wide-spread acceptance in industry. One strand, the optimization-based automation, is often discarded due to inflated constraining setups, infeasible results or excessive run times. To address these deficits, this work proposes a alternative optimization flow featuring a designer’s intuition for feasible design spaces through integration of expert knowledge based on the gm/ID-method. Moreover, the extensive run times of simulation-based optimization flows are overcome by incorporating computationally efficient machine learning methods. Neural network surrogate models predicting eleven performance parameters increase the evaluation speed by 3 400× on average compared to a simulator. Additionally, they enable the use of optimization algorithms dependent on automatic differentiation, that would otherwise be unavailable in this field. First, an up to 4× more efficient way for sampling training data based on the aforementioned space is detailed. After presenting the architecture and training effort regarding the surrogate models, they are employed as part of the objective function for sizing three operational amplifiers with three different optimization algorithms. Additionally, the benefits of using the gm/ID-method become evident when considering technology migration, as previously found solutions may be reused for other technologies.
The vast majority of state-of-the-art integrated circuits are mixed-signal chips. While the design of the digital parts of the ICs is highly automated, the design of the analog circuitry is largely done manually; it is very time-consuming; and prone to error. Among the reasons generally listed for this is often the attitude of the analog designer. The fact is that many analog designers are convinced that human experience and intuition are needed for good analog design. This is why they distrust the automated synthesis tools. This observation is quite correct, but this is only a symptom of the real problem. This paper shows that this phenomenon is caused by very concrete technical (and thus very rational) issues. These issues lie in the mode of operation of the typical optimization processes employed for the synthesizing tasks. I will show that the dilemma that arises in analog design with these optimizers is the root cause of the low level of automation in analog design. The paper concludes with a review of proposals for automating analog design
There is still a great reliance on human expert knowledge during the analog integrated circuit sizing design phase due to its complexity and scale, with the result that there is a very low level of automation associated with it. Current research shows that reinforcement learning is a promising approach for addressing this issue. Similarly, it has been shown that the convergence of conventional optimization approaches can be improved by transforming the design space from the geometrical domain into the electrical domain. Here, this design space transformation is employed as an alternative action space for deep reinforcement learning agents. The presented approach is based entirely on reinforcement learning, whereby agents are trained in the craft of analog circuit sizing without explicit expert guidance. After training and evaluating agents on circuits of varying complexity, their behavior when confronted with a different technology, is examined, showing the applicability, feasibility as well as transferability of this approach.
This paper presents a toolbox in Matlab/Octave for procedural design of analog integrated circuits. The toolbox contains all native functions required by analog designers (namely, schematic-generation, simulation setup and execution, integrated look-up tables and functions for design space exploration) to capture an entire design strategy in an executable script. This script - which we call an Expert Design Plan (EDP) - is capable of executing an analog circuit design fully automatically. The toolbox is integrated in an existing design flow. A bandgap reference voltage circuit is designed with this tool in less than 15 min.
This paper presents a machine learning powered, procedural sizing methodology based on pre-computed look-up tables containing operating point characteristics of primitive devices. Several Neural Networks are trained for 90nm and 45nm technologies, mapping different electrical parameters to the corresponding dimensions of a primitive device. This transforms the geometric sizing problem into the domain of circuit design experts, where the desired electrical characteristics are now inputs to the model. Analog building blocks or entire circuits are expressed as a sequence of model evaluations, capturing the sizing strategy and intention of the designer in a procedure, which is reusable across different technology nodes. The methodology is employed for the sizing of two operational amplifiers, and evaluated for two technology nodes, showing the versatility and efficiency of this approach.
This paper presents an improvement in usability and integrity of simulation-based analog circuit sizing. Instead of using geometrical sizing parameters (width, length), a transformed design-space, consisting exclusively of electrical parameters (branch currents, efficiencies and speed) is utilized. This design-space is explored more efficiently by optimizers. Moreover, this design-space can be reduced without affecting the quality of the result. The method is illustrated on two application examples, a symmetrical and a miller operational amplifier. Sizing the circuits using the transformed design-space showed significant reduction in required circuit simulations (up to 11x faster), better convergence, without loss in quality.
Electronic design automation approaches can roughly be divided into optimizers and procedures. While the former have enabled highly automated synthesis flows for digital integrated circuits, the latter play a vital (but mostly underestimated role) in the analog domain. This paper describes both automation strategies in comparison, identifying two fundamentally different automation paradigms that reflect the two basic design practices known as “top-down” and “bottom-up”. Then, with a focus on the latter, the history of procedural approaches is traced from their
early beginnings until today’s evolvements and future prospects to underline their practical importance and to accentuate their scientific value, both in itself and in the overall context of EDA.
Nowadays, the demand for a MEMS development/design kit (MDK) is even more in focus than ever before. In order to achieve a high quality and cost effectiveness in the development process for automotive and consumer applications, an advanced design flow for the MEMS (micro electro mechanical systems) element is urgently required. In this paper, such a development methodology and flow for parasitic extraction of active semiconductor devices is presented. The methodology considers geometrical extraction and links the electrically active pn junctions to SPICE standard library models and subsequently extracts the netlist. An example for a typical pressure sensor is presented and discussed. Finally, the results of the parasitic extraction are compared with fabricated devices in terms of accuracy and capability.
In this paper, we address the novel EDP (Expert Design Plan) principle for procedural design automation of analog integrated circuits, which captures the knowledge-based design strategy of human circuit designers in an executable script, making it reusable. We present the EDP Player, which enables the creation and execution of EDPs for arbitrary circuits in the Cadence® Virtuoso® Design Environment. The tool provides a generic version of an instruction set, called EDPL (EDPLanguage), enabling emulation of a typical manual analog sizing flow. To automate the design of a Miller Operational Amplifier and to create variants of a Smart Power IC, several EDPs were implemented using this tool. Employing these EDPs leads to a strong reduction of design time without compromising design quality or reliability.
IC layout automation with self-organized wiring and arrangement of responsive modules (SWARM)
(2019)
Focused on automating analog IC layout, the multi-agent-system Self-organized Wir ing and Arrangement of Responsive Modules (SWARM) combines the powers of pro-cedural generators and algorithmic optimization into a novel bottom-up meets top-down flow of supervised layout module interaction. Provoking self-organization via the effect of emergence, examples show SWARM finding even optimal placement solutions and producing constraint-compliant layout blocks which fit into a specified zone.
Lithographical hotspot (LH) detection using deep learning (DL) has received much attention in the recent years. It happens mainly due to the facts the DL approach leads to a better accuracy over the traditional, state-of-the-art programming approaches. The purpose of ths study is to compare existing data augmentation (DA) techniques for the integrated circuit (IC) mask data using DL methods. DA is a method which refers to the process of creating new samples similar to the training set, thereby helping to reduce the gap between classes as well as improving the performance of the DL system. Experimental results suggest that the DA methods increase overall DL models performance for the hotspot detection tasks.
The hotspot detection has received much attention in the recent years due to a substantial mismatch between lithography wavelength and semiconductor technology feature size. This mismatch causes diffraction when transferring the layout from design onto a silicon wafer. As a result, open or short circuits (i.e. lithography hotspots) are more likely to be produced. Additionally, increasing numbers of semiconductors devices on a wafer required more time for the lithography hotspot detection analysis. In this work, we propose a fast and accurate solution based on novel artificial neural network (ANN) architecture for precise lithography hotspot detection using a convolution neural network (CNN) adopting a state of-the-art technique. The experimental results showed that the proposed model gained accuracy improvement over current state-of-theart approaches. The final code has been made publicly available.
Electromigration (EM) is becoming a progressively severe reliability challenge due to increased interconnect current densities. A shift from traditional (post-layout) EM verification to robust (pro-active) EM aware design - where the circuit layout is designed with individual EM-robust solutions - is urgently needed. This tutorial will give an overview of EM and its effects on the reliability of present and future integrated circuits (ICs). We introduce the physical EM process and present its specific characteristics that can be affected during physical design. Examples of EM countermeasures which are applied in today’s commercial design flows are presented. We show how to improve the EM-robustness of metallization patterns and we also consider mission proiles to obtain application-oriented current density limits. The increasing interaction of EM with thermal migration is investigated as well. We conclude with a discussion of application examples to shift from the current post layout EM verification towards an EM aware physical design process. Its methodologies, such as EM-aware routing, increase the EM-robustness of the layout with the overall goal of reducing the negative impact of EM on the circuit’s reliability.
A procedural approach to automate the manual design process in analog integrated circuit design
(2018)
This paper presents a novel approach to automating the design of analog integrated circuits: (1) the Expert Design Plan (EDP), a procedural generator, and (2) the EDP Language, a high-level description language for writing an EDP. An EDP is a parameterizable, executable script, which reproduces a designer’s course of action when designing a circuit. Thus, an EDP formalizes the design expert’s knowledge-based strategy and makes it reusable. Since it is essential that an EDP represents a circuit designers’ way of thinking and working as close as possible, the designers themselves should be enabled to create the EDP. Therefore, our approach provides a input method through a domain-specific language called EDP Language (EDPL). Using this language is intuitive and requires no special training. In an exemplary implementation of our approach, a common-source amplifier is automatically sized using a set of only 10 instructions. Even in the first usage our EDP approach has appeared to be more efficient than the manual sizing process.
Im Vergleich zum digitalen Layoutentwurf weist der analoge Layoutentwurf einen wesentlich geringeren Automatisierungsgrad auf. Dies gilt insbesondere für den Layoutentwurf von Hochfrequenzschaltungen, wo Einflüsse der lokalen Layoutumgebung besonders zu berücksichtigen sind. Bei dieser sog. Kontextabhängigkeit geraten sowohl Optimierungsalgorithmen als auch herkömmliche Generatoransätze schnell an Grenzen. In dieser Arbeit wird eine funktionale Erweiterung des bekannten Generatorprinzips eingesetzt, die es erlaubt, Informationen aus der Layoutumgebung der Instanz in die Layoutgenerierung einzubeziehen. Mit dieser sog. kontextbasierten PCell gelingt die Automatisierung konkreter, bisher nur manuell lösbarer Probleme des Layoutentwurfs von Hochfrequenzschaltungen. Die Arbeit zeigt das Potential kontextbasierter PCells für die weitere Steigerung des Automatisierungsgrades im analogen Layoutentwurf.
This paper introduces a novel placement methodology for a common-centroid (CC) pattern generator. It can be applied to various integrated circuit (IC) elements, such as transistors, capacitors, diodes, and resistors. The proposed method consists of a constructive algorithm which generates an initial, close to the optimum, solution, and an iterative algorithm which is used subsequently, if the output of constructive algorithm does not satisfy the desired criteria. The outcome of this work is an automatic CC placement algorithm for IC element arrays. Additionally, the paper presents a method for the CC arrangement evaluation. It allows for evaluating the quality of an array, and a comparison of different placement methods.
A new method for the analysis of movement dependent parasitics in full custom designed MEMS sensors
(2017)
Due to the lack of sophisticated microelectromechanical systems (MEMS) component libraries, highly optimized MEMS sensors are currently designed using a polygon driven design flow. The strength of this design flow is the accurate mechanical simulation of the polygons by finite element (FE) modal analysis. The result of the FE-modal analysis is included in the system model together with the data of the (mechanical) static electrostatic analysis. However, the system model lacks the dynamic parasitic electrostatic effects, arising from the electric coupling between the wiring and the moving structures. In order to include these effects in the system model, we present a method which enables the quasi dynamic parasitic extraction with respect to in-plane movements of the sensor structures. The method is embedded in the polygon driven MEMS design flow using standard EDA tools. In order to take the influences of the fabrication process into account, such as etching process variations, the method combines the FE-modal analysis and the fabrication process simulation data. This enables the analysis of dynamic changing electrostatic parasitic effects with respect to movements of the mechanical structures. Additionally, the result can be included into the system model allowing the simulation of positive feedback of the electrostatic parasitic effects to the mechanical structures.
We present a new methodology for automatic selection and sizing of analog circuits demonstrated on the OTA circuit class. The methodology consists of two steps: a generic topology selection method supported by a “part-sizing” process and subsequent final sizing. The circuit topologies provided by a reuse library are classified in a topology tree. The appropriate topology is selected by traversing the topology tree starting at the root node. The decision at each node is gained from the result of the part-sizing, which is in fact a node-specific set of simulations. The final sizing is a simulation-based optimization. We significantly reduce the overall simulation effort compared to a classical simulation-based optimization by combining the topology selection with the part-sizing process in the selection loop. The result is an interactive user friendly system, which eases the analog designer’s work significantly when compared to typical industrial practice in analog circuit design. The topology selection method and sizing process are implemented as a tool into a typical analog design environment. The design productivity improvement achievable by our method is shown by a comparison to other design automation approaches.
Layout generators, commonly denoted as PCells (parameterized cells), play an important role in the layout design of analog ICs (integrated circuits). PCells can automatically create parts of a layout, whose properties are controlled by the PCell parameters. Any layout, whether hand-crafted or automatically generated, has to be verified against design rules using a DRC (design rule check) in order to assure proper functionality and producibility. Due to the growing complexity of today’s PCells it would be beneficial if a PCell itself could be ensured to produce DRC clean layouts for any allowed parameter values, i.e. a formal verification of the PCell’s code rather than checking all possible instances of the PCell. In this paper we demonstrate the feasibility of such a formal PCell verification for a simple NMOS transistor PCell. The set from which the parameter values can be chosen was found during the verification process.
In contrast to IC design, MEMS design still lacks sophisticated component libraries. Therefore, the physical design of MEMS sensors is mostly done by simply drawing polygons. Hence, the sensor structure is only given as plain graphic data which hinders the identification and investigation of topology elements such as spring, anchor, mass and electrodes. In order to solve this problem, we present a rule-based recognition algorithm which identifies the architecture and the topology elements of a MEMS sensor. In addition to graphic data, the algorithm makes use of only a few marking layers, as well as net and technology information. Our approach enables RC-extraction with commercial field solvers and a subsequent synthesis of the sensor circuit. The mapping of the extracted RC-values to the topology elements of the sensor enables a detailed analysis and optimization of actual MEMS sensors.