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Reflectometry is known since long as an interferometric method which can be used to characterize surfaces and thin films regarding their structure and,to a certain degree,composition as well.Properties like layer structures,layer thickness,density,and interface roughness can be determined by fitting the obtained reflectivity data with an appropriate model using a recursive fitting routine. However,one major drawback of the reflectometric method is its restriction to planar surfaces.In this article we demonstrate an approach to apply X-ray and neutron reflectometry to curved surfaces by means of the example of bent bare and coated glass slides.We prove the possibility to observe all features like Fresnel decay,Kiessig fringes,Bragg peaks and off-specular scattering and are able to interpret the data using common fitting software and to derive quantitative results about roughness,layer thickness and internal structure. The proposed method has become practical due to the availability of high quality 2D-detectors. It opens up the option to explore many kinds and shapes of samples,which,due to their geometry,have not been in the focus of reflectometry techniques until now.
Polyelectrolyte multilayer (PEM) are thin polymeric films produced by alternating adsorption of positively and negatively charged polyelectrolytes (PE) on a substrate. These films are considered drug delivery agents as well as coating material for implants, due to their antibiofouling and biologically benign properties. For these reasons the film mechanical properties as well as response to mechanical stress are important measurement parameters. Especially intriguing is the correlation of the mechanical properties of PEM on macroscopic level with the structure of PEM on molecular level, which is addressed here for the first time. This study investigates PEM from PDADMA/PSS produced by spraying technique with neutron and X-ray reflectometry. Reflectometry technique provides precise information on thickness and density (i.e., electron density or scattering length density, respectively), and, this way, allows to conclude on changes in film composition. Thus, neutron and X-ray reflectometry technique is suitable to investigate the overall and the internal transformations, which PEM films might undergo upon exposure to mechanical load. During uniaxial elongation two regimes of PEM deformation can be observed: An elastic regime at small elongations (below ca. 0.2%), which is characterized by a reversible change of film thickness, and a plastic regime with a permanent change above this limit. Both regimes have in common, that the mechanical load induces an increase of the film thickness, which is accompanied by an uptake of water from the surrounding atmosphere. The strain causes a molecular rearrangement within the PEM-structure of stratified layers, which, even in elastic regime, is permanent, although the thickness change remains reversible.