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Scanning Near-Field Optical Microscopy (SNOM) has developed during recent decades into a valuable tool to optically image the surface topology of materials with super-resolution. With aperture-based SNOM systems, the resolution scales with the size of the aperture, but also limits the sensitivity of the detection and thus the application for spectroscopic techniques like Raman SNOM. In this paper we report the extension of solid immersion lens (SIL) technology to Raman SNOM. The hemispherical SIL with a tip on the bottom acts as an apertureless dielectric nanoprobe for simultaneously acquiring topographic and spectroscopic information. The SIL is placed between the sample and the microscope objective of a confocal Raman microscope. The lateral resolution in the Raman mode is validated with a cross section of a semiconductor layer system and, at approximately 180 nm, is beyond the classical diffraction limit of Abbe.
Unter der Zielsetzung der multimodalen, ortsaufgelösten optischen Spektroskopie für die markierungsfreie Charakterisierung biologischer Materialien nach Morphologie und Chemie werden vier Themenschwerpunkte behandelt.
1. Theorie der elastischen / inelastischen Lichtstreuung und laterale Auflösung in der Mikroskopie
2. Erweiterung eines Raman Mikroskops zu einem multimodalen spektralen Imaging System (MSIS) mit Photonenmigrations-Technologie
3. Erweiterung des MSIS zu Super-Resolution Raman Mikroskopie mit einer Festkörper-Immersionslinse
4. Anwendung des entwickelten MSIS auf biologische Materialien