The level shifter and the floating gate supply for high-side transistors are a major challenge in high-voltage DCDC converters. This paper presents a high speed and power-efficient level shifter for voltages of up to 50V, suitable for both PMOS and NMOS power FETs. A switching node falling edge detection allows both, a sensitive and safe signal detection. This enables a robust operation during steep dv / dt transitions and a power consumption as low as 4.1 pJ per switching cycle, which is a reduction of more than 40% compared to prior art. An active clamping circuit prevents common mode displacement currents into the high-side supply. The level shifter is implemented in a 180nm BiCMOS technology. Measurements confirm a 50V 120MHz high-speed operation of the level shifter with a rising / falling propagation delay of 1.45 ns / 1.3 ns, respectively. The dv / dt robustness has been confirmed by measurements for transitions up to 6V/ ns.
Drei Stufen geben Sicherheit
(2018)
GaN-Transistoren bieten ein enormes Potenzial für kompakte Leistungselektronik, indem sie die Größe von passiven Bauelementen verringern. Allerdings bringt das schnelle Schalten Herausforderungen für den Gate-Treiber mit sich. Ein vollständig integrierter Treiber mit drei Spannungsstufen hilft, diese zu lösen.
Die Erfindung betrifft einen Energieübertrager (100) zur induktiven Energieübertragung von einem primären Schaltkreis (10) des Energieübertragers (100) an eine erste (5) und eine zweite (15) Spannungsdomäne eines sekundären Schaltkreises (20) des Energieübertragers (100) und zur Informationsübertragung vom sekundären Schaltkreis (20) zum primären Schaltkreis (10). Dabei umfasst der Energieübertrager (100): – einen Transformator (30), über den der primäre Schaltkreis (10) und der sekundäre Schaltkreis (20) induktiv miteinander gekoppelt sind und über den sowohl die Energieübertragung als auch die Informationsübertragung erfolgt; und – ein Amplitudenmodulationsmodul (50) zum Modulieren der Strom- und/oder Spannungsamplitude im sekundären Schaltkreis (20) mit Hilfe eines Amplitudenmodulationsschalters (55), wobei der Amplitudenmodulationsschalter (55) zwischen der ersten (5) und zweiten (15) Spannungsdomäne des sekundären Schaltkreises (20) angeordnet ist und ausgelegt ist, durch Öffnen und Schließen des Amplitudenmodulationsschalters (55) die Strom- und/oder Spannungsamplitude im primären Schaltkreis (10) zu ändern, um somit Information vom sekundären Schaltkreis (20) zum primären Schaltkreis (10) zu übertragen. Die vorliegende Erfindung betrifft ferner einen Gate-Treiber zum Schalten eines Leistungsschalters (500) und ein Verfahren zur induktiven Übertragung von Energie und zur kombinierten Informationsübertragung.
This article covers the design of highly integrated gate drivers and level shifters for high-speed, high power efficiency and dv/dt robustness with focus on automotive applications. With the introduction of the 48 V board net in addition to the conventional 12 V battery, there is an increasing need for fast switching integrated gate drivers in the voltage range of 50 V and above. State-of-the-art drivers are able to switch 50 V in less than 5 ns. The high-voltage electrical drive train demands for galvanic isolated and highly integrated gate drivers. A gate driver with bidirectional signal transmission with a 1 MBit/s amplitude modulation, 10/20 MHz frequency modulation and power transfer over one single transformer will be discussed. The concept of high-voltage charge storing enables an area-efficient fully integrated bootstrapping supply with 70 % less area consumption. EMC is a major concern in automotive. Gate drivers with slope control optimize EMC while maintaining good switching efficiency. A current mode gate driver, which can change its drive current within 10 ns, results in 20 dBuV lower emissions between 7 and 60 MHz and 52 % lower switching loss compared to a conventional constant current gate driver.
The increasing slew rate of modern power switches can increase the efficiency and reduce the size of power electronic applications. This requires a fast and robust signal transmission to the gate driver of the high-side switch. This work proposes a galvanically isolated capacitive signal transmission circuit to increase common mode transient immunity (CMTI). An additional signal path is introduced to significantly improve the transmission robustness for small duty cycles to assure a safe turn-off of the power switch. To limit the input voltage range at the comparator on the secondary side during fast high-side transitions, a clamping structure is implemented. A comparison between a conventional and the proposed signal transmission is performed using transistor level simulations. A propagation delay of about 2 ns over a wide range of voltage transients of up to 300V/ns at input voltages up to 600V is achieved.
This work presents a fully integrated GaN gate driver in a 180nm HV BCD technology that utilizes high-voltage energy storing (HVES) in an on-chip resonant LC tank, without the need of any external capacitor. It delivers up to 11nC gate charge at a 5V GaN gate, which exceeds prior art by a factor of 45-83, supporting a broad range of GaN transistor types. The stacked LC tank covers an area of only 1.44mm², which corresponds to a superior value of 7.6nC/mm².