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More and more power electronics applications utilize GaN transistors as they enable higher switching frequencies in comparison to conventional Si devices. Faster switching shrinks down the size of passives and enables compact solutions in applications like renewable energy, electrical cars and home appliances. GaN transistors benefit from ~10× smaller gate charge QG and gate drive voltages in the range of typically 5V vs. ~15V for Si.
Die Erfindung betrifft eine Vorrichtung (100) und ein Verfahren zum elektrischen Verbinden und Trennen zweier elektrischer Potentiale (1, 2). Des Weiteren betrifft die Erfindung eine Verwendung der Vorrichtung (100). Dabei umfasst die Vorrichtung (100): – ein erstes Modul, welches einen ersten und einen zweiten Transistor (10a, 10b) umfasst, wobei der erste Transistor (10a) antiseriell zu dem zweiten Transistor (10b) geschaltet ist; und – ein zweites Modul, welches einen dritten und einen vierten Transistor (10c, 10d) umfasst, wobei der dritte Transistor (10c) antiseriell zu dem vierten Transistor (10d) geschaltet ist; wobei das erste Modul und das zweite Modul parallel geschaltet sind.
This article covers the design of highly integrated gate drivers and level shifters for high-speed, high power efficiency and dv/dt robustness with focus on automotive applications. With the introduction of the 48 V board net in addition to the conventional 12 V battery, there is an increasing need for fast switching integrated gate drivers in the voltage range of 50 V and above. State-of-the-art drivers are able to switch 50 V in less than 5 ns. The high-voltage electrical drive train demands for galvanic isolated and highly integrated gate drivers. A gate driver with bidirectional signal transmission with a 1 MBit/s amplitude modulation, 10/20 MHz frequency modulation and power transfer over one single transformer will be discussed. The concept of high-voltage charge storing enables an area-efficient fully integrated bootstrapping supply with 70 % less area consumption. EMC is a major concern in automotive. Gate drivers with slope control optimize EMC while maintaining good switching efficiency. A current mode gate driver, which can change its drive current within 10 ns, results in 20 dBuV lower emissions between 7 and 60 MHz and 52 % lower switching loss compared to a conventional constant current gate driver.
This work presents a fully integrated GaN gate driver in a 180nm HV BCD technology that utilizes high-voltage energy storing (HVES) in an on-chip resonant LC tank, without the need of any external capacitor. It delivers up to 11nC gate charge at a 5V GaN gate, which exceeds prior art by a factor of 45-83, supporting a broad range of GaN transistor types. The stacked LC tank covers an area of only 1.44mm², which corresponds to a superior value of 7.6nC/mm².