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Im Vergleich zum digitalen Layoutentwurf weist der analoge Layoutentwurf einen wesentlich geringeren Automatisierungsgrad auf. Dies gilt insbesondere für den Layoutentwurf von Hochfrequenzschaltungen, wo Einflüsse der lokalen Layoutumgebung besonders zu berücksichtigen sind. Bei dieser sog. Kontextabhängigkeit geraten sowohl Optimierungsalgorithmen als auch herkömmliche Generatoransätze schnell an Grenzen. In dieser Arbeit wird eine funktionale Erweiterung des bekannten Generatorprinzips eingesetzt, die es erlaubt, Informationen aus der Layoutumgebung der Instanz in die Layoutgenerierung einzubeziehen. Mit dieser sog. kontextbasierten PCell gelingt die Automatisierung konkreter, bisher nur manuell lösbarer Probleme des Layoutentwurfs von Hochfrequenzschaltungen. Die Arbeit zeigt das Potential kontextbasierter PCells für die weitere Steigerung des Automatisierungsgrades im analogen Layoutentwurf.
Electromigration (EM) is becoming a progressively severe reliability challenge due to increased interconnect current densities. A shift from traditional (post-layout) EM verification to robust (pro-active) EM aware design - where the circuit layout is designed with individual EM-robust solutions - is urgently needed. This tutorial will give an overview of EM and its effects on the reliability of present and future integrated circuits (ICs). We introduce the physical EM process and present its specific characteristics that can be affected during physical design. Examples of EM countermeasures which are applied in today’s commercial design flows are presented. We show how to improve the EM-robustness of metallization patterns and we also consider mission proiles to obtain application-oriented current density limits. The increasing interaction of EM with thermal migration is investigated as well. We conclude with a discussion of application examples to shift from the current post layout EM verification towards an EM aware physical design process. Its methodologies, such as EM-aware routing, increase the EM-robustness of the layout with the overall goal of reducing the negative impact of EM on the circuit’s reliability.