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Analytical estimation of parasitic ringing overvoltage in fast switching half-bridges

  • Modern wide bandgap power devices promise higher power conversion performance if the device can be operated reliably. As switching speed increases, the effects of parasitic ringing become more prominent, causing potentially damaging overvoltages during device turn-off. Estimating the expected additional voltage caused by such ringing enables more reliable designs. In this paper, we present an analytical expression to calculate the expected overvoltage caused by parasitic ringing based on parasitic element values and operating point parameters. Simulations and measurements confirm that the expression can be used to find the smallest rise time of the switches’ drain-source voltage for minimum overvoltage. The given expression also allows the prediction of the trade off overvoltage amplitude in case of faster required rise times.

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Metadaten
Author of HS ReutlingenCzerwenka, Philipp; Maier, Jannik; Wolfer, Tobias; Schullerus, Gernot; Hennig, Eckhard
DOI:https://doi.org/10.23919/EPE23ECCEEurope58414.2023.10264309
ISBN:978-9-0758-1541-2
Erschienen in:2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe), 4-8 September 2023, Aalborg, proceedings
Publisher:IEEE
Place of publication:Piscataway, NJ
Document Type:Conference proceeding
Language:English
Publication year:2023
Tag:breakdown; estimation technique; half bridge; parasitic elements; wide bandgap devices
Page Number:7
First Page:1
Last Page:7
DDC classes:600 Technik
Open access?:Nein
Licence (German):License Logo  In Copyright - Urheberrechtlich geschützt